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Journal Article

Karunagaran, B and Kumar, Rajendra TR and Kumar, Senthil V and Mangalaraj, D and Narayandass, SK and Rao, Mohan G (2003) Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies. In: Materials Science in Semiconductor Processing, 6 (5-6). pp. 547-550.

Karunagaran, B and Kumar, Rajendra RT and Viswanathan, C and Mangalaraj, D and Narayandass, Sa K and Rao, Mohan G (2003) Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry. In: Crystal Research and Technology, 38 (9). pp. 773-778.

Karunagaran, B and Kumar, Rajendra RT and Mangalaraj, D and Narayandass, Sa K and Rao, Mohan G (2002) Influence of thermal annealing on the composition and structural parameters of DC magnetron sputtered titanium dioxide thin films. In: Crystal Research and Technology, 37 (12). pp. 1285-1292.