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Journal Article

Kondaiah, P and Jagadish Chandra, SV and Fortunato, E and Chel Jong, C and Mohan Rao, G and Koti Reddy, DVR and Uthanna, S (2020) Substrate temperature influenced ZrO2 films for MOS devices. In: Surface and Interface Analysis, 52 (9). pp. 541-546.

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