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Ramaswamy, Geetha and Raychaudhuri, AK and Goswami, Jaydeb and Shivashankar, SA (1997) Scanning tunneling microscope study of the morphology of chemical vapor deposited copper films and its correlation with resistivity. In: Journal of Applied Physics, 82 (8). pp. 3797-3807.
Ramaswamy, Geetha and Raychaudhuri, AK and Goswami, Jaydeb and Shivashankar, SA (1997) Large deviation from Matthiessen’s rule in chemical vapour deposited copper films and its correlation with nanostructure. In: Journal of Physics D: Applied Physics, 30 (5). L5-L9.