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Chandra, MM and Prasad, M (1985) On the ideality factor of Schottky diodes at low temperatures. In: Physica status solidi (a), 87 (1). K97 -K100.
Chandra, MM and Kumaran, V (1984) A simple circuit to aid direct measurement of capture cross sections of deep level impurities. In: Journal Of Physics E-Scientific Instruments, 17 (11). pp. 949-951.
Gupta, DS and Chandra, MM and Kumar, V (1983) Direct Measurement of Interface State Electron Capture Cross-Section in MOS System by DLTS Technique. In: Physica Status Solidi A, 80 (2). K209-K211.
Chandra, MM and Suryan, G (1983) Low-intensity differential photocapacitance of MOS structures. In: Solid-State Electronics, 26 (8). pp. 731-737.
Chandra, MM and Prasad, M (1983) Schottky Barrier Characteristics at Low Temperatures. In: Physica Status Solidi A, 77 (2). pp. 715-719.
