Number of items: 2.
Conference Paper
Chakraborty, Arpan and Mane, Anil U and Shivashankar, SA and Venkataraman, V
(2003)
Effect of Post-Metallization Hydrogen Annealing on C-V Characteristic of Zirconia Grown Using Atomic Layer Deposition.
In: Novel Materials and Processes for Advanced CMOS. Symposium, 2-4 Dec. 2002, Boston, MA, USA, pp. 143-7.
Journal Article
Chakraborty, Arpan and Mane, Anil U and Shivashankar, SA and Venkataraman, V
(2002)
Effect of Post-Metallization Hydrogen Annealing on C-V Characteristic of Zirconia Grown Using Atomic Layer Deposition.
In: MRS Proceedings, 745
(N5.2).
.
This list was generated on Wed Apr 24 03:29:09 2024 IST.
