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Conference Paper

Bid, Aveek and Bora, Achyut and Raychaudhuri, Arup K (2005) Experimental study of Rayleigh instability in metallic nanowires using resistance fluctuations measurements from 77K to 375K. In: SPIE: Fluctuations and Noise in Materials II, 24 May, Austin, TX, USA, Vol.5843, 147 -154.

Bora, Achyut and Raychaudhuri, Arup K (2004) Study of conductance fluctuations (1/f alpha noise) in metal film with electromigration stressing. In: SPIE: Fluctuations and Noise in Materials, 26th May, Maspalomas Gran Canaria Island, Spain, Vol.5469, 353-361.

Journal Article

Bora, Achyut and Raychaudhuri, AK (2009) Scanning thermal microscope study of a metal film under current stressing: role of temperature inhomogeneity in the damage process. In: Journal of Physics D: Applied Physics, 42 (3). 035503-1.

Bora, Achyut and Raychaudhuri, AK (2008) Low-frequency resistance fluctuations in metal films under current stressing at low temperature (T<0.3Tmelting). In: Physical Review B: Condensed Matter and Materials Physics, 77 (7).

Bid, Aveek and Bora, Achyut and Raychaudhuri, AK (2007) Debye Temperature of Metallic Nanowires—An Experimental Determination from the Resistance of Metallic Nanowires in the Temperature Range 4.2 K-300 K. In: Journal of Nanoscience and Nanotechnology, 7 (6). pp. 1867-1870.

Bid, Aveek and Bora, Achyut and Raychaudhuri, AK (2006) 1/f Noise in nanowires. In: Nanotechnology, 17 (1). pp. 152-156.

Bora, Achyut and Raychaudhuri, AK (2006) Evolution of 1/f α noise during electromigration stressing of metal film: Spectral signature of electromigration process. In: Journal of Applied Physics, 99 (11). p. 113701.

Bid, Aveek and Bora, Achyut and Raychaudhuri, AK (2005) Observation of large low-frequency resistance fluctuations in metallic nanowires: Implications on its stability. In: Physical Review B, 72 (11).