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Number of items: 3.

Venkatesh, C and Bhat, N (2008) Reliability Analysis of Torsional MEMS Varactor. In: IEEE Transactions on Device and Materials Reliability, 8 (1). pp. 129-134.

Babu, Naseer P and Govind, G and Prasad, SMS and Bhat, KN (2007) Electrical and Reliability Studies of "Wet $N_2O$" Tunnel Oxides Grown on Silicon for Flash Memory Applications. In: IEEE Transactions on Device and Materials Reliability, 7 (3). pp. 420-428.

Saxena, Prashant Kumar and Bhat, Navakanta (2003) SEU Reliability Improvement Due to Source-Side Charge Collection in the Deep-Submicron SRAM Cell. In: IEEE Transactions on Device and Materials Reliability, 3 (1). pp. 14-17.

This list was generated on Thu Apr 22 23:09:12 2021 IST.