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Number of items: 4.

Shankar, Bhawani and Gupta, Sayak Dutta and Soni, Ankit and Raghavan, Srinivasan and Shrivastava, Mayank (2019) ESD Behavior of AlGaN/GaN Schottky Diodes. In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 19 (2). pp. 437-444.

Mishra, Abhishek and Gossner, Harald and Shrivastava, Mayank (2017) ESD Behavior of MWCNT Interconnects-Part I: Observations and Insights. In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 17 (4). pp. 600-607.

Mishra, Abhishek and Shrivastava, Mayank (2017) ESD Behavior of MWCNT Interconnects-Part II: Unique Current Conduction Mechanism. In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 17 (4). pp. 608-615.

Shrivastava, Mayank and Kulshrestha, Neha and Gossner, Harald (2014) ESD Investigations of Multiwalled Carbon Nanotubes. In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 14 (1). pp. 555-563.

This list was generated on Thu Apr 22 23:03:37 2021 IST.