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Number of items: 2.

Patnaik, LM and Jamadagni, HS and Agrawal, VK and Varaprasad, BKSVL (2002) The state of VLSI testing. In: IEEE Potentials, 21 (3). pp. 12-16.

Rajesh, KG (1997) Expert systems: Their implications and applications for power systems. In: IEEE Potentials, 16 (2). pp. 35-37.

This list was generated on Tue Apr 20 01:28:34 2021 IST.