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Kumar, Arvind and Mondal, Sandip and Rao, K S R, Koteswara (2017) Experimental evidences of charge transition levels in ZrO2 and at the Si: ZrO2 interface by deep level transient spectroscopy. In: APPLIED PHYSICS LETTERS, 110 (13).
Kumar, Arvind and Mondal, Sandip and Rao, K S R , Koteswara (2017) Tunable band alignment and dielectric constant of solution route fabricated Al/HfO2/Si gate stack for CMOS applications. In: JOURNAL OF APPLIED PHYSICS, 121 (8).