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Goyal, M and Chaturvedi, M and Kumar, R and Vaidya, M and Shrivastava, M (2024) Load-line Dependent Current Filament Dynamics in N anoscale SCR Devices. In: IEEE International Reliability Physics Symposium, IRPS 2024, 14 April 2024through 18 April 2024, Grapevine.
Goyal, M and Chaturvedi, M and Kumar, R and Vaidya, M and Shrivastava, M (2024) Missing Trigger Circuit Action and Device Engineering for Conventional Nanoscale SCR. In: IEEE International Reliability Physics Symposium, IRPS 2024, 14 April 2024through 18 April 2024, Grapevine.
Marini, C and Joseph, B and Caramazza, S and Capitani, F and Bendele, M and Mitrano, M and Chermisi, D and Mangialardo, S and Pal, B and Goyal, M and Iadecola, A and Mathon, O and Pascarelli, S and Sarma, DD and Postorino, P (2014) Local disorder investigation in NiS2-xSex using Raman and Ni K-edge x-ray absorption spectroscopies. In: JOURNAL OF PHYSICS-CONDENSED MATTER, 26 (45).
