Number of items: 2.
Goyal, M and Chaturvedi, M and Kumar, R and Vaidya, M and Shrivastava, M
(2024)
Load-line Dependent Current Filament Dynamics in N anoscale SCR Devices.
In: IEEE International Reliability Physics Symposium, IRPS 2024, 14 April 2024through 18 April 2024, Grapevine.
Goyal, M and Chaturvedi, M and Kumar, R and Vaidya, M and Shrivastava, M
(2024)
Missing Trigger Circuit Action and Device Engineering for Conventional Nanoscale SCR.
In: IEEE International Reliability Physics Symposium, IRPS 2024, 14 April 2024through 18 April 2024, Grapevine.
This list was generated on Sun Dec 22 06:55:01 2024 IST.
