Maligi, Anantha Sunil and Jampana, Nagaraju and Gowravaram, Mohan Rao (2017) Growth and Characterization Studies of ZnS Thin Films Prepared by Single Source Evaporation Technique. In: 61st DAE-Solid State Physics Symposium, DEC 26-30, 2016, KIIT Univ, Bhubaneswar, INDIA.
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Zinc sulfide thin films are deposited on glass substrates using thermal evaporation technique. Effect of thickness on the properties of as-deposited ZnS films is studied. ZnS films exhibited cubic structure with preferential orientation along (111) plane. All the films exhibited n-type conductivity with resistivity ranging in the order of 10(5) to 10(6) Omega-cm. The transmittance in the visible region is in the range of 80 to 89% and the band gap of the material varied from 3.65 to 3.52 eV. The as-deposited films can be used as window layer for fabrication of hetero-junction solar cell.
| Item Type: | Conference Proceedings |
|---|---|
| Series.: | AIP Conference Proceedings |
| Additional Information: | Copy right for this article belongs to the AMER INST PHYSICS, 2 HUNTINGTON QUADRANGLE, STE 1NO1, MELVILLE, NY 11747-4501 USA |
| Department/Centre: | Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics |
| Date Deposited: | 11 Nov 2017 04:20 |
| Last Modified: | 11 Nov 2017 04:20 |
| URI: | http://eprints.iisc.ac.in/id/eprint/58232 |
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