Praveena, Manimunda and Bain, Colin D and Jayaram, Vikram and Biswas, Sanjay K (2013) Total internal reflection (TIR) Raman tribometer: a new tool for in situ study of friction-induced material transfer. In: RSC ADVANCES, 3 (16). pp. 5401-5411.
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The sliding history in friction-induced material transfer of dry 2H-MoS2 particles in a sheared contact was studied. Video images in contact showed fragmentation of lubricant particles and build-up of a transfer film, and were used to measure the speed of fragmented particles in the contact region. Total internal reflection (TIR) Raman spectroscopy was used to follow the build-up of the MoS2 transfer film. A combination of in situ and ex situ analysis of the mating bodies revealed the thickness of the transfer film at steady state to be of the order of 35 nm on the ball surface and 15 nm on the flat substrate. Insights into the mechanism of formation of the transfer film in the early stages of sliding contact are deduced.
| Item Type: | Journal Article |
|---|---|
| Publication: | RSC ADVANCES |
| Publisher: | ROYAL SOC CHEMISTRY |
| Additional Information: | Copyright for this article belongs to the ROYAL SOC CHEMISTRY, ENGLAND. |
| Department/Centre: | Division of Mechanical Sciences > Mechanical Engineering Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy) |
| Date Deposited: | 09 May 2013 11:24 |
| Last Modified: | 09 May 2013 11:24 |
| URI: | http://eprints.iisc.ac.in/id/eprint/46506 |
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