Optical and structural properties of TiO2 films deposited by Sol-Gel technique

Hemissi, M and Amardjia-Adnani, H (2007) Optical and structural properties of TiO2 films deposited by Sol-Gel technique. In: Digest Journal of Nanomaterials and Biostructures, 27th -31st Dec.2007.

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Abstract

TiO2 thin films were prepared by sol gel method. The structural investigations performed by means of X- ray diffraction (XRD) technique, Scanning electronic microscopy (SEM) showed the shape structure at T=600°C. The optical constants of the deposited film were obtained from the analysis of the experimental recorded transmittance spectral data over the wavelengths range 200-3000 nm. The values of some important parameters (refractive index n, dielectric constant ε ∞ and thickness d), and the third order optical nonlinear susceptibility χ(3) of TiO2 film are determined from these spectra. It has been found that the dispersion data obey the single oscillator relation of the Wemple-DiDomenico model, from which the dispersion parameters and high – frequency dielectric constant were determined. The estimation of the corresponding band gap Eg , χ (3) and ε ∞ are 2.57 eV, 0.021 × 10-10 esu and 5.20,respectively.

Item Type:	Conference Paper
Keywords:	Titanium oxide;Optical properties;Thin film;MEB
Department/Centre:	Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited:	21 Oct 2011 05:14
Last Modified:	21 Oct 2011 05:14
URI:	http://eprints.iisc.ac.in/id/eprint/41536

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