ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Thermal Aware Test Methodology of 3-D Integrated SoC

Vinay, NS and Larsson, Erik and Singh, Virendra (2009) Thermal Aware Test Methodology of 3-D Integrated SoC. In: Workshop on 3-D Integration: Architecture, Design and Test (in conjunction with DATE’09), Apr 2009.

Full text not available from this repository. (Request a copy)
Item Type: Conference Paper
Department/Centre: Division of Interdisciplinary Sciences > Supercomputer Education & Research Centre
Date Deposited: 16 Dec 2011 07:00
Last Modified: 16 Dec 2011 07:00
URI: http://eprints.iisc.ac.in/id/eprint/41247

Actions (login required)

View Item View Item