Chaudhuri, Ayan Roy and Krupanidhi, SB (2010) Investigation of true remnant polarization response in heterostructured artificial biferroics. In: Solid State Communications, 150 (13-14). pp. 660-662.
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Abstract
Epitaxial bilayered thin films composed of ferromagnetic La0.6Sr0.4MnO3 and ferroelectric 0.7Pb (Mg1/3Nb2/3)O3-0.3(PbTiO3) were fabricated on LaAlO3 (100) substrates by pulsed laser ablation. Ferroelectric, ferromagnetic and magneto-dielectric characterizations performed earlier indicated the possible existence of strain-mediated magneto-electric coupling in these biferroic heterostructures. In order to investigate their true remnant polarization characteristics, usable in devices, room-temperature polarization versus electric field, positive-up negative-down (PUND) pulse polarization studies and remnant hysteresis measurements were carried out. The PUND and remnant hysteresis measurements revealed the significant contribution of the non-remnant component in the observed polarization hysteresis response of these heterostructures. (C) 2010 Published by Elsevier Ltd
Item Type: | Journal Article |
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Publication: | Solid State Communications |
Publisher: | Elsevier Science |
Additional Information: | Copyright of this article belongs to Elsevier Science. |
Keywords: | Thin films;Pulsed laser ablation;Ferroelectrics;Biferroics |
Department/Centre: | Division of Chemical Sciences > Materials Research Centre |
Date Deposited: | 09 Jun 2010 05:07 |
Last Modified: | 19 Sep 2010 06:00 |
URI: | http://eprints.iisc.ac.in/id/eprint/27242 |
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