Black-Box DC-DC Integrated Circuit Modeling towards Design for EMC in Automotive Electronics

Ishibashi, N and Manepalli, LK and Nath, D and Nayak, BP and Kadam, S and Gope, D (2021) Black-Box DC-DC Integrated Circuit Modeling towards Design for EMC in Automotive Electronics. In: 2021 Joint IEEE International Symposium on Electromagnetic Compatibility Signal and Power Integrity, and EMC Europe, 26 jul - 20 aug 2021, Europe, pp. 810-814.

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Abstract

Recently, IoT and sensor networks have developed rapidly and design for EMC has become challenging. In automotive electronics, V2X technology that enables Advanced Driver Assistance Systems (ADAS) has led to stringent EMC requirements for in-vehicle equipment. Therefore, in addition to noise countermeasure technology, it is becoming important to predict EMC risk. Simulation is an effective method to analyze and monitor EMI/EMC performance right from the early design stage, such that possible upstream problems can be addressed in a cost-effective manner. A primary challenge towards such a simulation methodology is the non-availability of models for Integrated Circuits which are the sources of noise. In this work, by measuring the EMC characteristics of the DC-DC converter IC from outside, a macro-model is created without including any proprietary information of the IC interior. This is combined with an electromagnetic simulation framework to generate system-level EMC results. The proposed model-based simulation methodology is validated with measurements for a DC-DC converter system. © 2021 IEEE.

Item Type:	Conference Paper
Publication:	2021 Joint IEEE International Symposium on Electromagnetic Compatibility Signal and Power Integrity, and EMC Europe, EMC/SI/PI/EMC Europe 2021
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Additional Information:	The copyright for this article belongs to Institute of Electrical and Electronics Engineers Inc.
Keywords:	Advanced driver assistance systems; Automobile drivers; Availability; Cost effectiveness; Electromagnetic compatibility; Integrated circuit design; Integrated circuits; Sensor networks; Timing circuits, Black boxes; Conducted emission; Conducted emissions; IC-Models; ICEM-conducted emission; IEC-62433-2; Radiated emission; Radiated emissions; Simulation methodology, DC-DC converters
Department/Centre:	Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited:	17 Nov 2021 11:25
Last Modified:	17 Nov 2021 11:28
URI:	http://eprints.iisc.ac.in/id/eprint/70506

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