Investigations on Electro-Thermal Ageing of Metal Oxide Surge Arrester Elements: A Realistic Laboratory Simulation

Vipin, PM and Nagabhushana, GR and Jayaram, BN (1991) Investigations on Electro-Thermal Ageing of Metal Oxide Surge Arrester Elements: A Realistic Laboratory Simulation. In: 3rd International Conference on Properties and Applications of Dielectric Materials, 1991, 8-12 July, Tokyo,Japan, Vol.2, 1152-1155.

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Abstract

The ageing of metal oxide surge arresters (MOSA) under field operating conditions caused by a combination of electrical and thermal stresses is simulated in the laboratory in an attempt to characterize the degradation phenomena as well as to identify the significant indices of such a degradation. Other than the widely adopted leakage current index, the prospects of parameters such as barrier height$(\emptyset B)$, capacitance, tan delta, nonlinearity coefficient$(\alpha)$, and area ratio as sensitive degradation indices are studied. Also, the effect of electro-thermal aging on the V-I characteristics as a whole, up to the breakdown voltage of the MOSA, is presented. The simulation is carried out on a `one day=one year' (of the arrester's field life) basis. The accelerated aging for this purpose followed an empirical transient electrical stress pattern, while the IEC guidelines were followed for selection of continuous operating voltage (c.o.v) of the arrester and the scheme of thermal stresses.

Item Type:	Conference Paper
Publisher:	IEEE
Additional Information:	Copyright 1990 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Department/Centre:	Division of Electrical Sciences > High Voltage Engineering (merged with EE)
Date Deposited:	29 May 2006
Last Modified:	19 Sep 2010 04:27
URI:	http://eprints.iisc.ac.in/id/eprint/7044

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