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Visible Light Response in Defect Engineered Wrinkle Network Nanostructured ZnO

Rudra, K (2020) Visible Light Response in Defect Engineered Wrinkle Network Nanostructured ZnO. In: 4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 - Proceedings, 6-21 April 2020, Penang; Malaysia.

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Official URL: https://dx.doi.org/10.1109/EDTM47692.2020.9117916

Abstract

This study demonstrates the deposition of ZnO nanostructured thin films by simple low-cost sol-gel spin coating technique. Solution processing can be used to modulate the properties of semiconductors by introducing defects. As deposited and annealed ZnO thin films show photoluminescence emission in visible region. XRD confirms the formation of hexagonal wurtzite structure for both annealed and unannealed samples. Transmittance and absorbance have been recorded using UV-Vis spectroscopy. SEM images show a wrinkle network morphology with branches comprised of nanoparticles. The ability to modulate the conductivity on shining white light has been demonstrated with a high I/Idark. © 2020 IEEE.

Item Type: Conference Paper
Publication: 4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 - Proceedings
Publisher: Institute of Electrical and Electronics Engineers Inc.
Additional Information: cited By 0; Conference of 4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 ; Conference Date: 6 April 2020 Through 21 April 2020; Conference Code:161190
Keywords: Defects; Deposition; Electron devices; II-VI semiconductors; Light; Morphology; Oxide minerals; Sol-gels; Thin films; Ultraviolet visible spectroscopy; Wide band gap semiconductors; Zinc oxide; Zinc sulfide, Hexagonal wurtzite structure; Nanostructured thin film; Network morphology; Photoluminescence emission; Sol-gel spin coating; Solution-processing; UV-vis spectroscopy; Visible-light response, Semiconducting zinc compounds
Department/Centre: Division of Interdisciplinary Sciences > Centre for Nano Science and Engineering
Date Deposited: 06 Nov 2020 11:22
Last Modified: 06 Nov 2020 11:22
URI: http://eprints.iisc.ac.in/id/eprint/67003

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