ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Inspection Allocation in Manufacturing Systems Using Stochastic Search Techniques

Viswanadham, N and Sharma, Shashi M and Taneja, Mukesh (1996) Inspection Allocation in Manufacturing Systems Using Stochastic Search Techniques. In: IEEE Transactions on Systems, Man and Cybernetics, Part A, 26 (2). 222 -230.


Download (1MB)


Quality is the hallmark of a competitive product. It is necessary to use inspection stations to check product quality and process performance. In this paper, the authors are concerned with the problem of location of inspection stations in a multistage manufacturing system. The authors present two stochastic search algorithms for solving this problem, one based on simulated annealing and the other on genetic algorithms. These algorithms are developed to determine the location of inspection stations resulting in a minimum expected total cost in a multistage manufacturing system. The total cost includes inspection, processing and scrapping cost at each stage of the production process. A penalty cost is also included in it to account for a defective item which is not detected by the inspection scheme. A set of test examples are solved using these algorithms. The authors also compare performance of these two algorithms.

Item Type: Journal Article
Additional Information: Copyright 1990 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Department/Centre: Division of Electrical Sciences > Computer Science & Automation
Depositing User: HS Usha
Date Deposited: 25 Aug 2008
Last Modified: 19 Sep 2010 04:26
URI: http://eprints.iisc.ac.in/id/eprint/6558

Actions (login required)

View Item View Item