Power Electronic Converter Based Flexible Transmission Line Emulation

Dutta, S and Mazumdar, S and Basu, K (2020) Power Electronic Converter Based Flexible Transmission Line Emulation. In: IEEE Transactions on Industrial Electronics, 67 (8). pp. 6195-6205.

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Abstract

A power electronic converter based transmission line emulator (TLE) is presented in this paper. The TLE can emulate medium and long lines in steady-state and symmetrical faults occurring at any point in the line. A traveling wave based numerical scheme for the emulation of the line is identified and then implemented on a novel digital architecture in the field-programmable gate array part of a system on chip platform. The proposed architecture meets the real-time computation constraints through parallel processing and optimal use of hardware resources (DSP slices, block RAMs, etc.). A comprehensive analysis to determine the two important parameters of the TLE - the power converter switching frequency and observer update period while satisfying a number of constraints coming from the numerical scheme, power, and embedded hardware - has been presented. Finally, relevant simulation and experimental results on a developed 400-V 15-kVA TLE prototype have been presented for validation. © 2019 IEEE.

Item Type:	Journal Article
Publication:	IEEE Transactions on Industrial Electronics
Publisher:	Institute of Electrical and Electronics Engineers Inc. (IEEE)
Additional Information:	cited By 0 ; Institute of Electrical and Electronics Engineers Inc. (IEEE)
Keywords:	Computer architecture; Electric lines; Field programmable gate arrays (FPGA); Power electronics; Switching frequency; System-on-chip; Transmissions, Comprehensive analysis; Digital architecture; Flexible transmissions; Parallel processing; Power electronic converters; Proposed architectures; Real-time computations; System-on-chip platforms, Power converters
Department/Centre:	Division of Electrical Sciences > Electrical Engineering
Date Deposited:	20 Oct 2020 06:22
Last Modified:	20 Oct 2020 06:22
URI:	http://eprints.iisc.ac.in/id/eprint/65214

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