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Defects, conductivity and photoconductivity in Ar+ bombarded KTaO 3

Tomar, Ruchi and Wadehra, Neha and Kumar, Shelender and Venkatesan, Ananth and Sarma, D D and Maryenko, Denis and Chakraverty, S (2019) Defects, conductivity and photoconductivity in Ar+ bombarded KTaO 3. In: JOURNAL OF APPLIED PHYSICS, 126 (3).

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Official URL: https://dx.doi.org/10.1063/1.5099546


Oxygen vacancies play a crucial role in the conductivity of oxides. Here, we report the photoresponse of the electron doped surface of Ar + bombarded oxygen vacant (001) KTaO 3 (KTO) single crystal. The bombardment time defines the amount of oxygen vacancies and hence the electron doping level. The time evolution of photoresponse to daylight illumination remains independent of the carrier density and follows the biexponential function. By contrast, the amplitude of the photoresponse increases with the decreasing charge carrier density. The samples show distinct responses in terms of amplitude as well as response time to the illumination with laser light of wavelengths 633, 532, and 405nm. The defect states distribution within the bandgap is calculated with the photoconductivity relaxation, which involves deep sensitizing hole traps. The combined results of electrical conductivity, photoconductivity, atomic force microscopy, and Kelvin probe force microscopy suggest that the conductivity produced on the KTO surface is not continuous throughout the surface. Rather, Ar + bombardment creates oxygen deficiency patches that are oriented along some preferential crystal orientations and interconnected with each other, thus producing percolating conducting channels on the surface of the sample. Under light illumination, photocarriers are generated in these conducting channels.

Item Type: Journal Article
Additional Information: copyright for this article belongs to AMER INST PHYSICS
Department/Centre: Division of Chemical Sciences > Solid State & Structural Chemistry Unit
Depositing User: Id for Latest eprints
Date Deposited: 05 Sep 2019 06:29
Last Modified: 05 Sep 2019 06:29
URI: http://eprints.iisc.ac.in/id/eprint/63415

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