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Effect of methylamine vapor exposure and ambient ageing on Cs(x)MA(1-x)PbI(3-x)Br(x) perovskites for improved carrier collection

Singh, Akash and Chouhan, Arun Singh and Avasthi, Sushobhan (2019) Effect of methylamine vapor exposure and ambient ageing on Cs(x)MA(1-x)PbI(3-x)Br(x) perovskites for improved carrier collection. In: MATERIALS RESEARCH EXPRESS, 6 (8).

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Official URL: https://doi.org/10.1088/2053-1591/ab1f4f

Abstract

Caesium-methylammonium lead iodide-bromide perovskites (Cs(x)MA(1-x)PbI(3-x)Br(x)) is interesting for stable and high-voltage tandem solar cells. Here, we report a systematic material and device study of Cs(x)MA(1-x)PbI(3-x)Br(x) (x = 0, 5, 10 and 15%) perovskite films. Cs-Br incorporation reduces carrier lifetime of as-deposited films, from 21.5 mu s for x = 0% to 5.8 mu s for x = 15%. Unlike pure MA films, Cs-Br incorporated films were not only more resilient to degradation, their carrier lifetime increased by 50%-300% when exposed to ambient due to the humidity-assisted healing. The morphology of asdeposited films was poor. Methylamine vapor exposure (MVE) was used to improve the morphology and crystallinity, which further improved carrier lifetime up to 50 ps. Devices with efficiency >17% were fabricated on MVE treated Cs(0.10)MA(0.90)PbI(2.90)Br(0.10) films. The short circuit current density was further increased by fabricating devices on `aged' films which have higher lifetime due to humidity healing. Best Cs(0.10)MA(0.90)PbI(2.90)Br(0.10) devices show good ambient stability with V-OC and FF unchanged even after 5 days of ambient exposure.

Item Type: Journal Article
Additional Information: copyright for this article belongs to IOP PUBLISHING LTD
Keywords: carrier collection; carrier lifetime; humidity healing; methylamine healing; mixed-cation perovskites; solar-cells
Department/Centre: Division of Interdisciplinary Research > Centre for Nano Science and Engineering
Depositing User: Id for Latest eprints
Date Deposited: 23 Jul 2019 09:25
Last Modified: 23 Jul 2019 09:25
URI: http://eprints.iisc.ac.in/id/eprint/62853

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