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Enhanced coherence and decoupled surface states in topological insulators through structural disorder

Banerjee, Abhishek and Ganesan, R and Kumar, P S Anil (2018) Enhanced coherence and decoupled surface states in topological insulators through structural disorder. In: APPLIED PHYSICS LETTERS, 113 (7).

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Official URL: http://dx.doi.org/10.1063/1.5033428

Abstract

To harness the true potential of topological insulators as quantum materials for information processing, it is imperative to maximise topological surface state conduction while simultaneously improving their quantum coherence. However, these goals have turned out to be contradictory. Surface dominated transport in topological insulators has been achieved primarily through compensation doping of bulk carriers which introduces tremendous electronic disorder and drastically deteriorates electronic coherence. In this work, we use structural disorder instead of electronic disorder to manipulate the electrical properties of thin films of topological insulator Bi2Se3. We achieve decoupled surface state transport in our samples and observe significantly suppressed carrier dephasing rates in the coupled surface state regime. As the film thickness is decreased, the dephasing rate evolves from a linear to a super-linear temperature dependence. While the former is consistent with Nyquist electron-electron interactions, the latter leads to significantly enhanced coherence at low temperatures and is indicative of energy exchange due to frictional drag between the two surface states. Our work opens up the way to harness topological surface states, without being afflicted by the deleterious effects of compensation doping. Published by AIP Publishing.

Item Type: Journal Article
Additional Information: Copy right for this article belong to AMER INST PHYSICS, 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Depositing User: Id for Latest eprints
Date Deposited: 06 Sep 2018 15:44
Last Modified: 06 Sep 2018 15:44
URI: http://eprints.iisc.ac.in/id/eprint/60587

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