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Real-time compensation of errors in refractive index shift measurements of microring sensors using thermo-optic coefficients

Prasad, Prashanth R and Selvaraja, Shankar K and Varma, Manoj (2018) Real-time compensation of errors in refractive index shift measurements of microring sensors using thermo-optic coefficients. In: OPTICS EXPRESS, 26 (10). pp. 13461-13473.

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Official URL: https://dx.doi.org/10.1364/OE.26.013461

Abstract

We report a method for compensation of errors caused by temperature fluctuations in refractive index measurements using Silicon photonic microring sensors. The method involves determination of resonance wavelength shifts caused by thermal fluctuations using real-time measurement of on-chip temperature variations and thermo-optic coefficient (TOC) of analyte liquids. Resistive metal lines patterned around Silicon microrings are used to track temperature variations and TOC of analyte is calculated by measuring wavelength shifts caused by controlled increments in device temperature. The TOC of de-ionized water is determined to be -1.12 x 10(-4) / degrees C, with an accuracy of +/- 8.26 x 10 (-6) / degrees C. In our system, chip-surface temperature variations were measured with an instrument limited precision of 0.004 degrees C yielding a factor of 16 enhancement in tracking accuracy compared to conventional, bottom-of-chip temperature measurement. We show that refractive index detection limit of the microring sensor is also improved by the same factor. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

Item Type: Journal Article
Additional Information: Copy right of this article belong to OPTICAL SOC AMER, 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering
Division of Interdisciplinary Research > Centre for Nano Science and Engineering
Depositing User: Id for Latest eprints
Date Deposited: 27 Jun 2018 17:46
Last Modified: 27 Jun 2018 17:46
URI: http://eprints.iisc.ac.in/id/eprint/60095

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