ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Computationally Tractable Algorithms for Finding a Subset of Non-Defective Items From a Large Population

Sharma, Abhay and Murthy, Chandra R (2017) Computationally Tractable Algorithms for Finding a Subset of Non-Defective Items From a Large Population. In: IEEE TRANSACTIONS ON INFORMATION THEORY, 63 (11). pp. 7149-7165.

[img] PDF
IEEE_TRA_INF_63-11_7149_2017.pdf - Published Version
Restricted to Registered users only

Download (961kB) | Request a copy
Official URL: http://doi.org/10.1109/TIT.2017.2748143


In the classical non-adaptive group testing setup, pools of items are tested together, and the main goal of a recovery algorithm is to identify the complete defective set given the outcomes of different group tests. In contrast, the main goal of a non-defective subset recovery algorithm is to identify a subset of non-defective items given the test outcomes. In this paper, we present a suite of computationally efficient and analytically tractable non-defective subset recovery algorithms. By analyzing the probability of error of the algorithms, we obtain bounds on the number of tests required for non-defective subset recovery with arbitrarily small probability of error. Our analysis accounts for the impact of both the additive noise (false positives) and dilution noise (false negatives). By comparing with information theoretic lower bounds, we show that the upper bounds on the number of tests are orderwise tight up to a log(2) K factor, where K is the number of defective items. We also provide simulation results that compare the relative perthrmance of the different algorithms and reveal insights into their practical utility. The proposed algorithms significantly outperform the straightforward approaches of testing items one-by-one, and of first identifying the defective set and then choosing the non-defective items from the complement set, in terms of the number of measurements required to ensure a given success rate.

Item Type: Journal Article
Additional Information: Copy right for this article belongs to the IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering > Electrical Communication Engineering - Technical Reports
Depositing User: Id for Latest eprints
Date Deposited: 17 Nov 2017 05:26
Last Modified: 17 Nov 2017 05:26
URI: http://eprints.iisc.ac.in/id/eprint/58262

Actions (login required)

View Item View Item