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Feasibility of Strain Detection in Graphene NEMS Using Silicon Photonics

Dash, Aneesh and Naik, Akshay and Selvaraja, Shankar Kumar (2017) Feasibility of Strain Detection in Graphene NEMS Using Silicon Photonics. In: 29th IEEE Photonics Conference (IPC), OCT 02-06, 2016 Sponsor(s):IEEE, Waikoloa, HI, pp. 829-830.

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Official URL: http://doi.org/10.1109/IPCon.2016.7831085

Abstract

We propose an integrated silicon photonicsbased transduction scheme to characterize graphene nano-electromechanical systems (NEMS) by sensing refractive index change caused by strain in the device. We show that Mach-Zehnder interferometer supporting TM mode at 1550 nm wavelength shows the best sensitivity to strain in graphene.

Item Type: Conference Proceedings
Additional Information: Copy right for this article belongs to the IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Department/Centre: Division of Interdisciplinary Research > Centre for Nano Science and Engineering
Depositing User: Id for Latest eprints
Date Deposited: 30 Sep 2017 09:19
Last Modified: 30 Sep 2017 09:19
URI: http://eprints.iisc.ac.in/id/eprint/57953

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