ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Low Current Switching Behavior of IGBT and Associated Spurious Tripping in Inverters Employing V-CE De-saturation Protection

Venkatramanan, D and Adapa, Anil Kumar and Upamanyu, Kapil and John, Vinod (2017) Low Current Switching Behavior of IGBT and Associated Spurious Tripping in Inverters Employing V-CE De-saturation Protection. In: 2016 IEEE INTERNATIONAL CONFERENCE ON POWER ELECTRONICS, DRIVES AND ENERGY SYSTEMS (PEDES) , DEC 14-17, 2016, Trivandrum, INDIA.

[img] PDF
IEEE_Int_Con_Pow_Ele_Dri_Ene_Sys_2017.pdf - Published Version
Restricted to Registered users only

Download (2MB) | Request a copy
Official URL: http://doi.org/10.1109/PEDES.2016.7914284


Insulated gate bipolar transistors (IGBT) have evolved significantly and become exceedingly fast. Today, their typical switching speeds are of the order of 100 ns. The resulting dv/dt is considerably large and when employed in a variable speed motor drive inverter, ringing over-voltages occur at the motor terminals even with cable as short as 1 meter in length. In any such power converter system, protection of IGBT in the event of a fault is an essential requirement. An effective way of protection is by detecting IGBT de-saturation, which occurs during device over-current or short-circuit, using sensed collector-emitter voltage (V-CE). Several commercial isolated gate-driver ICs are available today in the market with integrated V-CE de-saturation protection feature. Such a protection scheme when employed in a modern IGBT based power converter and used for motor drive applications can lead to spurious trips. This paper investigates and reports the reasons for such spurious fault sensing by IGBT gate-drivers employed in two-level inverters. The circuit conditions are analyzed and it is shown that the IGBTs essentially act as capacitors while switching low currents. This behavior in combination with other factors such as fast device switching times, load power factor, and dead-time, is shown to cause spurious V-CE fault trips. Two simple and cost-effective circuit modifications are suggested which ensure that such spurious fault sensing is avoided in power converters.

Item Type: Conference Proceedings
Publisher: IEEE, 345 E 47TH ST, NEW YORK, NY 10017 US
Additional Information: Copy right for this article belongs to the IEEE International Conference on Power Electronics, Drives and Energy Systems (PEDES), Trivandrum, INDIA, DEC 14-17, 2016
Department/Centre: Division of Electrical Sciences > Electrical Engineering
Date Deposited: 23 Sep 2017 04:53
Last Modified: 23 Sep 2017 04:53
URI: http://eprints.iisc.ac.in/id/eprint/57901

Actions (login required)

View Item View Item