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Noise Analysis in Ring Oscillator-based Capacitance Sensor Interface

Gaggatur, Javed S and Banerjee, Gaurab (2016) Noise Analysis in Ring Oscillator-based Capacitance Sensor Interface. In: 59th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), OCT 16-19, 2016, Abu Dhabi, U ARAB EMIRATES, pp. 553-556.

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Official URL: http://dx.doi.org/10.1109/MWSCAS.2016.7870078

Abstract

Biomedical sensors use capacitance measurement for a variety of detection applications and capacitance measurement in the tens of femto-farad range need a low-noise environment. The capacitance sensor interface converts the capacitance change to frequency change to mitigate the noise and to operate in a noisy environment. Using differential sensing architecture and calibration, the frequency domain technique allows measuring small capacitance values even in the presence of large parasitic capacitance. The impact of the voltage variation due to temperature or supply is removed by one-point calibration The test circuit was designed in 130-nm CMOS technology and the capacitance was measured for 1-100 fF having a nominal (or parasitic) capacitance of 1pF.

Item Type: Conference Proceedings
Additional Information: Copy right for this article belongs to the IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering
Depositing User: Id for Latest eprints
Date Deposited: 29 Jul 2017 10:20
Last Modified: 29 Jul 2017 10:20
URI: http://eprints.iisc.ac.in/id/eprint/57523

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