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Aluminium-26 grain boundary diffusion in pure and Y-doped polycrystalline alpha-alumina

Fielitz, Peter and Kelm, Klemens and Bertram, Rainer and Chokshi, Atul H and Borchardt, Guenter (2017) Aluminium-26 grain boundary diffusion in pure and Y-doped polycrystalline alpha-alumina. In: ACTA MATERIALIA, 127 . pp. 302-311.

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Official URL: http://dx.doi.org/10.1016/j.actamat.2017.01.005


Aluminium grain boundary diffusivities were measured in pure and Y-doped polycrystalline alpha-Al2O3 using the artificial aluminium isotope Al-26 as a tracer. An advanced preparation technique for the Al-26 tracer source enabled secondary ion mass spectrometry (SIMS) measurements to analyse the Al-2 depth distributions in the polycrystalline materials. Simultaneously performed O-18 and (26)AI tracer diffusion experiments demonstrated clearly in the most direct way that Al-26 grain boundary diffusion is significantly faster than O-18 grain boundary diffusion. There was no significant difference in aluminium grain boundary diffusivities in pure and Y-doped polycrystalline alpha-Al2O3. The experimental results of this work imply that diffusion creep in alumina is unlikely to be controlled by Al grain boundary diffusion. (C) 2017 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Item Type: Journal Article
Additional Information: Copy right for this article belongs to the PERGAMON-ELSEVIER SCIENCE LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND
Department/Centre: Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Depositing User: Id for Latest eprints
Date Deposited: 20 May 2017 04:27
Last Modified: 01 Mar 2019 07:44
URI: http://eprints.iisc.ac.in/id/eprint/56857

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