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Sulfurization and annealing effects on thermally evaporated CZTS films

Sripan, Chinnaiyah and Madhavan, Vinod E and Viswanath, Annamraju Kasi and Ganesan, R (2017) Sulfurization and annealing effects on thermally evaporated CZTS films. In: MATERIALS LETTERS, 189 . pp. 110-113.

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Official URL: http://dx.doi.org/10.1016/j.matlet.2016.11.094


Thermally evaporated Cu2Zn1.5Sn1.2S4.4 (CZTS) films are annealed and sulfurized at different temperatures to study the structural modifications. The kesterite phase formation and phase purity of the CZTS films are compared and confirmed by X-ray diffraction and Raman spectroscopic technique. Surface oxidation state of the elements in the sulfurized film is studied by XPS. The calculated optical band gap of the 550 degrees C sulfurized CZTS film is found to be 1.56 eV; however getting modified due to annealing and sulfurization. The carrier concentration, resistance and mobility of the sulfurized films are found to be 2.8x10(14) cm(-3), 2686 Omega/square and 8.2 cm(2)V(-1)s(-1) respectively and the conduction type is p-type. This study sheds light on the effect of annealing and sulfurization on various phase-modifications and the light-harvesting capability of CZTS absorber layers for solar cell applications.

Item Type: Journal Article
Additional Information: Copy right for this article belongs to the ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Depositing User: Id for Latest eprints
Date Deposited: 15 Mar 2017 04:29
Last Modified: 15 Mar 2017 04:29
URI: http://eprints.iisc.ac.in/id/eprint/56381

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