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Microhardness Studies of Vapour Grown Tin (II) Sulfide Single Crystals

Hegde, SS and Kunjomana, AG and Ramesh, K (2015) Microhardness Studies of Vapour Grown Tin (II) Sulfide Single Crystals. In: 59th DAE Solid State Physics Symposium, DEC 16-20, 2014, VIT Univ, Vellore, INDIA.

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Official URL: http://dx.doi.org/10.1063/1.4918038

Abstract

Earth abundant tin sulfide (SnS) has attracted considerable attention as a possible absorber material for low-cost solar cells due to its favourable optoelectronic properties. Single crystals of SnS were grown by physical vapour deposition (PVD) technique. Microindentation studies were carried out on the cleaved surfaces of the crystals to understand their mechanical behaviour. Microhardness increased initially with the load, giving sharp maximum at 15 g. Quenching effect has increased the microhardness, while annealing reduced the microhardness of grown crystals. The hardness values of as-grown, annealed and quenched samples at 15 g load are computed to be 99.69, 44.52 and 106.29 kg/mm(2) respectively. The microhardness of PVD grown crystals are high compared to CdTe, a leading low-cost PV material. The as-grown faces are found to be fracture resistant.

Item Type: Conference Proceedings
Additional Information: Copy right for this article belongs to the AMER INST PHYSICS, 2 HUNTINGTON QUADRANGLE, STE 1NO1, MELVILLE, NY 11747-4501 USA
Keywords: SnS; Photovoltaic materials; Physical vapour deposition (PVD); Single crystals; Microhardness
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Depositing User: Id for Latest eprints
Date Deposited: 14 Jan 2016 04:29
Last Modified: 14 Jan 2016 04:29
URI: http://eprints.iisc.ac.in/id/eprint/53111

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