Physical Insights on the Ambiguous Metal-Graphene Interface and Proposal for Improved Contact Resistance

Ghatge, Mayur and Shrivastava, Mayank (2015) Physical Insights on the Ambiguous Metal-Graphene Interface and Proposal for Improved Contact Resistance. In: IEEE TRANSACTIONS ON ELECTRON DEVICES, 62 (12). pp. 4139-4147.

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Abstract

The ambiguous behavior of metal-graphene interface has been addressed in this paper using density functional theory and nonequilibrium Green's function formalism. For the first time, the fundamental chemistry of metal-graphene interface, in particular role of sp-hybridized and sp(2)-hybridized carbon atoms, has been emphasized and discussed in detail in this paper. It was discovered that the sp-hybridized sites at the edge of a graphene monolayer contribute to 40% of current conduction when compared with sp(2)-hybridized atom sites in the graphene-metal overlap region. Moreover, we highlighted the insignificance of an additional metal layer, i.e., sandwiched contact, due to lacking sp-hybridized carbon sites. A fundamental way of defining the contact resistance, while keeping chemical bonding in mind, has been proposed. The bonding insight has been further used to propose the novel ways of interfacing metal with graphene, which results in a 40% reduction in contact resistance.

Item Type:	Journal Article
Publication:	IEEE TRANSACTIONS ON ELECTRON DEVICES
Publisher:	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Additional Information:	Copy right for this article belongs to the IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
Keywords:	Chemical bonding; contact resistance; edge contacts; graphene; metal-graphene interface; palladium-graphene interface
Department/Centre:	Division of Electrical Sciences > Electronic Systems Engineering (Formerly Centre for Electronic Design & Technology)
Date Deposited:	30 Dec 2015 06:02
Last Modified:	30 Dec 2015 06:02
URI:	http://eprints.iisc.ac.in/id/eprint/52936

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