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AIM-Spice Integration of a Recursive Model for Threshold Voltage Shift in Thin Film Transistors

Raghuraman, Mathangi and Sambandan, Sanjiv (2014) AIM-Spice Integration of a Recursive Model for Threshold Voltage Shift in Thin Film Transistors. In: JOURNAL OF DISPLAY TECHNOLOGY, 10 (6).

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Official URL: http://dx.doi.org/10.1109/JDT.2014.2308315

Abstract

Non-crystalline semiconductor based thin film transistors are the building blocks of large area electronic systems. These devices experience a threshold voltage shift with time due to prolonged gate bias stress. In this paper we integrate a recursive model for threshold voltage shift with the open source BSIM4V4 model of AIM-Spice. This creates a tool for circuit simulation for TFTs. We demonstrate the integrity of the model using several test cases including display driver circuits.

Item Type: Journal Article
Additional Information: Copyright for this article belongs to the IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
Keywords: Simulations; thin-film transistors (TFTs); threshold voltage shift
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Depositing User: Id for Latest eprints
Date Deposited: 27 Jun 2014 05:35
Last Modified: 27 Jun 2014 05:35
URI: http://eprints.iisc.ac.in/id/eprint/49366

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