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System-level SoC near-field (NF) emissions: Simulation to measurement correlation

Murugan, Rajen and Mukherjee, Souvik and Mi, Minhong and Pauc, Lionel and Girardi, Claudio (2012) System-level SoC near-field (NF) emissions: Simulation to measurement correlation. In: 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC), May 29 2012-June 1 2012, San Diego, CA.

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Official URL: http://dx.doi.org/10.1109/ECTC.2012.6248819

Abstract

As System-on-Chip (SoC) designs migrate to 28nm process node and beyond, the electromagnetic (EM) co-interactions of the Chip-Package-Printed Circuit Board (PCB) becomes critical and require accurate and efficient characterization and verification. In this paper a fast, scalable, and parallelized boundary element based integral EM solutions to Maxwell equations is presented. The accuracy of the full-wave formulation, for complete EM characterization, has been validated on both canonical structures and real-world 3-D system (viz. Chip + Package + PCB). Good correlation between numerical simulation and measurement has been achieved. A few examples of the applicability of the formulation to high speed digital and analog serial interfaces on a 45nm SoC are also presented.

Item Type: Conference Paper
Additional Information: Copyright of this article belongs to IEEE.
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering
Depositing User: Francis Jayakanth
Date Deposited: 19 Dec 2013 09:49
Last Modified: 19 Dec 2013 09:49
URI: http://eprints.iisc.ac.in/id/eprint/48029

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