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Group testing based spectrum hole search using a simple sub-nyquist sampling scheme

Sharma, Abhay and Murthy, Chandra R (2012) Group testing based spectrum hole search using a simple sub-nyquist sampling scheme. In: 2012 IEEE Global Communications Conference (GLOBECOM), 3-7 Dec. 2012, Anaheim, CA.

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Official URL: http://dx.doi.org/10.1109/GLOCOM.2012.6503330


In this paper, we consider the problem of finding a spectrum hole of a specified bandwidth in a given wide band of interest. We propose a new, simple and easily implementable sub-Nyquist sampling scheme for signal acquisition and a spectrum hole search algorithm that exploits sparsity in the primary spectral occupancy in the frequency domain by testing a group of adjacent subbands in a single test. The sampling scheme deliberately introduces aliasing during signal acquisition, resulting in a signal that is the sum of signals from adjacent sub-bands. Energy-based hypothesis tests are used to provide an occupancy decision over the group of subbands, and this forms the basis of the proposed algorithm to find contiguous spectrum holes. We extend this framework to a multi-stage sensing algorithm that can be employed in a variety of spectrum sensing scenarios, including non-contiguous spectrum hole search. Further, we provide the analytical means to optimize the hypothesis tests with respect to the detection thresholds, number of samples and group size to minimize the detection delay under a given error rate constraint. Depending on the sparsity and SNR, the proposed algorithms can lead to significantly lower detection delays compared to a conventional bin-by-bin energy detection scheme; the latter is in fact a special case of the group test when the group size is set to 1. We validate our analytical results via Monte Carlo simulations.

Item Type: Conference Paper
Additional Information: Copyright of this article belongs to IEEE.
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering
Depositing User: Francis Jayakanth
Date Deposited: 02 Dec 2013 10:42
Last Modified: 02 Dec 2013 10:42
URI: http://eprints.iisc.ac.in/id/eprint/47875

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