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Temperature dependence of threshold voltage for ultra thin silicon film symmetric double-gate MOSFETs

Medury, Aditya Sankar and Bhat, Navakanta and Bhat, KN (2011) Temperature dependence of threshold voltage for ultra thin silicon film symmetric double-gate MOSFETs. In: International Workshop on Physics of Semiconductor Devices, 19-22 Dec, 2011, Indian Institute of Technology Kanpur.

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Official URL: http://www.iitk.ac.in/iwpsd2011/
Item Type: Conference Paper
Additional Information: Copyright of this article belongs to IEEE.
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering
Depositing User: Id for Latest eprints
Date Deposited: 22 Mar 2013 07:32
Last Modified: 22 Mar 2013 07:32
URI: http://eprints.iisc.ac.in/id/eprint/46094

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