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Polynomial Coefficient Based Multi-Tone Testing of Analog Circuits

Sindia, Suraj and Singh, Virendra and Agrawal, Vishwani D (2009) Polynomial Coefficient Based Multi-Tone Testing of Analog Circuits. In: 18th IEEE North Atlantic Test Workshop (NATW) , May 2009, Boxborough, MA, USA.

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Abstract

Abstract—A method of testing for parametric faults of analog circuits based on a polynomial representaion of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the applied input voltage at relevant frequencies apart from DC. Classification of CUT is based on a comparison of the estimated polynomial coefficients with those of the fault free circuit. The method needs very little augmentation of circuit to make it testable as only output parameters are used for classification. This procedure is shown to uncover several parametric faults causing smaller than 5 % deviations the nominal values. Fault diagnosis based upon sensitivity of polynomial coefficients at relevant frequencies is also proposed.

Item Type: Conference Paper
Department/Centre: Division of Interdisciplinary Research > Supercomputer Education & Research Centre
Depositing User: Ms TV Yashodha
Date Deposited: 14 Dec 2011 12:39
Last Modified: 14 Dec 2011 12:40
URI: http://eprints.iisc.ac.in/id/eprint/41253

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