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Evolution of crystallographic texture during deformation of submicron grain size titanium

Gurao, NP and Suwas, Satyam (2011) Evolution of crystallographic texture during deformation of submicron grain size titanium. In: Journal of Materials Research, 26 (4). pp. 523-532.

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Abstract

Evolution of deformation texture in commercially pure titanium with submicron grain size (SMG) was studied using x-ray diffraction (XRD) and electron back scatter diffraction (EBSD) methods. The material was deformed by rolling at room temperature. The deformation mechanism was found to be slip dominated with a pyramidal <c + a> slip system facilitating plastic deformation. No evidence of tensile or compressive twinning was detected, as generally seen in the case of titanium with conventional microcrystalline grain size. The absence of twinning and the propensity of the pyramidal <c + a> slip system in the SMG Ti is attributed to the lack of coordinated motion of zonal partial dislocations that leads to twinning.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Cambridge University Press.
Department/Centre: Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Depositing User: Id for Latest eprints
Date Deposited: 29 Jul 2011 11:25
Last Modified: 29 Jul 2011 11:25
URI: http://eprints.iisc.ac.in/id/eprint/39615

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