Measurement of 1/f noise and its application in materials science

Raychaudhuri, AK (2002) Measurement of 1/f noise and its application in materials science. In: Current Opinion in Solid State & Materials Science, 6 (1). pp. 67-85.

PDF M_easurement_ofnoise_and.pdf - Published Version Restricted to Registered users only Download (1MB) | Request a copy

Abstract

This is a review of the measurement of I If noise in certain classes of materials which have a wide range of potential applications. This includes metal films, semi-conductors, metallic oxides and inhomogeneous systems such as composites. The review contains a basic introduction to this field, the theories and models and follows it up with a discussion on measurement methods. There are discussions on specific examples of the application of noise spectroscopy in the field of materials science. (C) 2002 Elsevier Science Ltd. All rights reserved.

Item Type:	Journal Article
Publication:	Current Opinion in Solid State & Materials Science
Publisher:	Elsevier Science
Additional Information:	Copyright of this article belongs to Elsevier Science.
Department/Centre:	Division of Physical & Mathematical Sciences > Physics
Date Deposited:	20 Jul 2011 05:52
Last Modified:	20 Jul 2011 05:52
URI:	http://eprints.iisc.ac.in/id/eprint/39272

Actions (login required)

View Item