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X-ray diffraction line profile analysis of deformation microstructure in boron modified Ti-6Al-4V alloy

Sarkar, Apu and Roy, Shibayan and Suwas, Satyarn (2011) X-ray diffraction line profile analysis of deformation microstructure in boron modified Ti-6Al-4V alloy. In: Materials Characterization, 62 (1). pp. 35-42.

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Official URL: http://dx.doi.org/10.1016/j.matchar.2010.10.007


X-ray diffraction line profile analysis (XRDLPA) techniques have been applied to investigate the deformed microstructure of a recently developed boron modified two-phase titanium alloy Ti-6Al-4V. The alloy was hot compressed at 750 degrees C up to 50% height reduction at two different strain rates (10(-3) S-1 and 1 S-1). Microstructural parameters like average domain size, average microstrain within the domain and dislocation density of the two phases were determined using X-ray diffraction line profile analysis. The results indicate an increase in the microstrain and dislocation density for the alpha-phase and decrease for the beta-phase in the case of boron modified alloys as compared to the normal material. Microstructural modifications viz, the grain refinement and the presence of hard, brittle TiB particles in the case of boron modified alloy are held responsible for the observed difference in the dislocation density. (C) 2010 Elsevier Inc. All rights reserved.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Elsevier Science.
Keywords: X-ray diffraction; Microstructure; Titanium alloys; Boron modification; Hot deformation
Department/Centre: Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Depositing User: Id for Latest eprints
Date Deposited: 09 Mar 2011 04:43
Last Modified: 09 Mar 2011 04:43
URI: http://eprints.iisc.ac.in/id/eprint/35889

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