Structural, dielectric and ferroelectric properties of multilayer lithium tantalate thin films prepared by sol-gel technique

Satapathy, S and Verma, Prabha and Gupta, PK and Mukherjee, Chandrachur and Sathe, VG and Varma, KBR (2011) Structural, dielectric and ferroelectric properties of multilayer lithium tantalate thin films prepared by sol-gel technique. In: Thin Solid Films, 519 (6). pp. 1803-1808.

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Abstract

Multilayer lithium tantalate thin films were deposited on Pt-Si Si(111)/SiO2/TiO2/Pt(111)]substrates by sol-gel process. The films were annealed at different annealing temperatures (300, 450 and 650 degrees C) for 15 min. The films are polycrystalline at 650 degrees C and at other annealing conditions below 650 degrees C the films are in amorphous state. The films were characterized using X-ray diffraction, atomic force microscopy (AFM) and Raman spectroscopy. The AFM of images show the formation of nanograins of uniform size (50 nm) at 650 degrees C. These polycrystalline films exhibit spontaneous polarization of 1.5 mu C/cm(2) at an application of 100 kV/cm. The dielectric constant of multilayer film is very small (6.4 at 10 kHz) as compared to that of single crystal. (C) 2010 Elsevier B.V. All rights reserved.

Item Type:	Journal Article
Publication:	Thin Solid Films
Publisher:	Elsevier Science
Additional Information:	Copyright of this article belongs to Elsevier Science.
Keywords:	Sol-gel process; Lithium tantalate; Atomic force microscopy; Hysteresis; Dielectric properties; Raman spectroscopy; X-ray diffraction
Department/Centre:	Division of Chemical Sciences > Materials Research Centre
Date Deposited:	09 Mar 2011 06:23
Last Modified:	09 Mar 2011 06:23
URI:	http://eprints.iisc.ac.in/id/eprint/35870

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