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Multi-Tone Testing of Linear and Nonlinear Analog Circuits using Polynomial Coefficients

Sindia, Suraj and Singh, Virendra and Agrawal, Vishwani D (2009) Multi-Tone Testing of Linear and Nonlinear Analog Circuits using Polynomial Coefficients. In: 18th Asian Test Symposium, NOV 23-26, 2009, Taichung.

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Abstract

A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the applied input voltage at relevant frequencies in addition to DC. Classification or Cur is based on a comparison of the estimated polynomial coefficients with those of the fault free circuit. This testing method requires no design for test hardware as might be added to the circuit fly some other methods. The proposed method is illustrated for a benchmark elliptic filter. It is shown to uncover several parametric faults causing deviations as small as 5% from the nominal values.

Item Type: Conference Paper
Additional Information: Copyright 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: Analog circuit test , Curve fitting , Multi-tone test ,Parametric faults , Polynomial coefficient testing
Department/Centre: Division of Electrical Sciences > Electronic Systems Engineering (Formerly Centre for Electronic Design & Technology)
Depositing User: Users 920 not found.
Date Deposited: 29 Mar 2010 07:24
Last Modified: 19 Sep 2010 05:58
URI: http://eprints.iisc.ac.in/id/eprint/26589

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