ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Microstructural characterization of ultrafine-grain interstitial-free steel by X-ray diffraction line profile analysis

Sarkar, Apu and Bhowmik, Ayan and Suwas, Satyam (2009) Microstructural characterization of ultrafine-grain interstitial-free steel by X-ray diffraction line profile analysis. In: Applied Physics A-Materials Science & Processing, 94 (4). pp. 943-948.

[img] PDF
1.pdf - Published Version
Restricted to Registered users only

Download (451kB) | Request a copy
Official URL: http://www.springerlink.com/content/p18u0174770642...

Abstract

This paper highlights the microstructural features of commercially available interstitial free (IF) steel specimens deformed by equal channel angular pressing (ECAP) up to four passes following the route A. The microstructure of the samples was studied by different techniques of X-ray diffraction peak profile analysis as a function of strain (epsilon). It was found that the crystallite size is reduced substantially already at epsilon=2.3 and it does not change significantly during further deformation. At the same time, the dislocation density increases gradually up to epsilon=4.6. The dislocation densities estimated from X-ray diffraction study are found to correlate very well with the experimentally obtained yield strength of the samples.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to springer.
Department/Centre: Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Depositing User: Rajalaxmi Ashok Govanakoppa
Date Deposited: 30 Oct 2009 11:26
Last Modified: 19 Sep 2010 05:27
URI: http://eprints.iisc.ac.in/id/eprint/19208

Actions (login required)

View Item View Item