Dielectric characterization of polycrystalline $Sr_{2}Bi{4}Ti_{5}O_{18}$

Srinivas, K and James, AR (1999) Dielectric characterization of polycrystalline $Sr_{2}Bi{4}Ti_{5}O_{18}$. In: Journal of Applied Physics, 86 (7). pp. 3885-3889.

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Abstract

Five layered Sr2Bi4Ti5O18 has been prepared in the ceramic form with a view to studying its electrical properties. X-ray and microstructural studies were employed for physical characterization. Detailed electrical property measurements were undertaken so as to understand the basic transport physics of this compound. The results of dielectric studies, dc conductivity, and ac impedance are discussed, and a defect formula for Sr2Bi4Ti5O18 has been proposed. The investigations on this material at high temperatures and frequencies reveal its stable behavior. (C) 1999 American Institute of Physics. [S0021-8979(99)01219-0].

Item Type:	Journal Article
Publication:	Journal of Applied Physics
Publisher:	American Institute of Physics
Additional Information:	Copyright of this article belongs to American Institute of Physics.
Department/Centre:	Division of Chemical Sciences > Materials Research Centre
Date Deposited:	01 Jun 2009 05:52
Last Modified:	19 Sep 2010 05:02
URI:	http://eprints.iisc.ac.in/id/eprint/18452

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