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1/f Noise in nanowires

Bid, Aveek and Bora, Achyut and Raychaudhuri, AK (2006) 1/f Noise in nanowires. In: Nanotechnology, 17 (1). pp. 152-156.

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Official URL: http://www.iop.org/EJ/article/0957-4484/17/1/024/n...


We have measured the low-frequency resistance fluctuations (1 mHz < f < 10 Hz) in Ag nanowires of diameter 15 nm ${\leq}d{\leq}$200 nm at room temperature. The power spectral density (PSD) of the fluctuations has a $ (1/f{^\alpha})$ character as seen in metallic films and wires of larger dimension.Additionally, the PSD has a significant low-frequency component and the value of α increases from the usual 1 to\simeq 3/2 as the diameter d is reduced.The value of the normalized fluctuations $({\Delta}{R^{2}})/({R^{2}})$ also increases as the diameter d is reduced. We observe that there are new features in the 1/ f noise as the size of the wire is reduced and they become more prominent as the diameter of the wires approaches 15 nm.It is important to investigate the origin of the new behaviour as 1/ f noise may become a limiting factor in the use of metal wires of nanometre dimensions as interconnects.

Item Type: Journal Article
Publication: Nanotechnology
Publisher: Institute of Physics Publishing Ltd
Additional Information: Copyright of this article belong to Institute of Physics and IOP Publishing Limited
Keywords: Electrical-Resistivity;Localization;Films;Engineering, Multidisciplinary;Nanoscience & Nanotechnology;Materials Science,Multidisciplinary;Physics, Applied
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Date Deposited: 27 Nov 2008 12:12
Last Modified: 19 Sep 2010 04:52
URI: http://eprints.iisc.ac.in/id/eprint/16601

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