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Structural and morphological properties of thermally evaporated $Zn_{1-x}Mn_xS$ nanocrystalline films

Reddy, Sreekantha D and Reddy, Maheswara M and Rao, Narasimha K and Gunasekhar, KR and Reddy, Sreedhara P (2007) Structural and morphological properties of thermally evaporated $Zn_{1-x}Mn_xS$ nanocrystalline films. In: Journal of Optoelectronics and Advanced Materials, 9 (12). pp. 3743-3746.

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In recent years the dilute magnetic semiconductors have received much attention due to the complementary properties of semiconductor and ferromagnetic behaviour. Nanostructured $Zn_{1-x}Mn_xS$ films $(0 \leq x \leq 0.25)$ were deposited on glass substrates at room temperature (300 K) using simple resistive thermal evaporation technique. All the deposited films were characterized by chemical, structural and morphological studies. Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) studies showed that all the films investigated were in nanocrystalline form with the grain size lying in the range 8 – 22 nm. All the films exhibited cubic structure and the lattice parameter varied linearly with composition.

Item Type: Journal Article
Publication: Journal of Optoelectronics and Advanced Materials
Publisher: INOE Publishing House
Additional Information: Copyright of this article belongs to INOE Publishing House.
Keywords: Diluted Magnetic Semiconductors (DMS);Thermal evaporation technique;Zn1-xMnxS Nanocrystalline films;Morphological studies;Structural studies.
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 26 Aug 2008
Last Modified: 19 Sep 2010 04:49
URI: http://eprints.iisc.ac.in/id/eprint/15668

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