Jacob, KT and Iwase, M (1983) Effect of pressure on the emf of solid-state cells. In: High Temperature Science, 16 (2). pp. 123-129.
Full text not available from this repository. (Request a copy)Abstract
The effect of pressure on the emf of solid-state galvanic cells: $Pt|Ni + NiO|ZrO_2(CaO)|Cu + Cu_2O|Pt (cell I) and Pt|SFeO + Fe_3O_4|ZrO_2(CaO)||Fe_3O_4 + Fe_2O_3|Pt$ (cell II) were measured in the pressure range 1.01 \times 105 to 8.08 \times 108 Pa. Within experimental error, the emf was found to vary linearly with pressure: EI (1000 K)/mV = 275.5 + 2.62 | 10-8 [(P/Pa) - 101,325] EII (896 K)/mV = 442.5 - 2.45 10-8 [(P/Pa) - 101,325]. These results are consistent with available data on entropy and volume changes associated with the cell reactions.
| Item Type: | Journal Article |
|---|---|
| Publication: | High Temperature Science |
| Publisher: | Humana Press |
| Additional Information: | Copyright belongs to Humana Press |
| Department/Centre: | Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy) |
| Date Deposited: | 09 Apr 2008 |
| Last Modified: | 27 Aug 2008 13:18 |
| URI: | http://eprints.iisc.ac.in/id/eprint/13566 |
Actions (login required)
 |
View Item |
