ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

A theoretical model for roughness induced crack closure

Ravichandran, KS (1990) A theoretical model for roughness induced crack closure. In: International Journal of Fracture, 44 (2). pp. 97-110.

[img] PDF
A_theoretical_model.pdf - Published Version
Restricted to Registered users only

Download (847kB) | Request a copy
Official URL: http://www.springerlink.com/content/q6432755n14q48...

Abstract

A theoretical model for the effects of grain size on the magnitude of roughness induced crack closure (RICC) at fatigue crack growth threshold has been proposed. With the basic configuration of a crack propagating incrementally along planar slip bands and deflecting at grain boundaries, an idealized zig-zag crack path is considered. The effective slip band length is considered to be equal to grain size. It is assumed that the dislocations emitted from the crack tip upon loading to form the pile-up are completely irreversible to produce a combined mode I and mode II displacement at the crack tip. The assumption of continuously distributed dislocations in the pile-up facilitated the calculation of crack tip sliding displacement (CTSD) along the slip plane from which the mode I closure disregistry just behind the crack tip can be calculated. The closure stress intensity factor at threshold, $K _{el,th}$ could then be expressed as a function of critical resolved shear stress, average macroscopic yield stress, angle subtended by the slip plane with the crack plane and the length of the slip band. Comparisons of the predicted trends with experimental data from various alloy systems indicate good agreement.

Item Type: Journal Article
Publication: International Journal of Fracture
Publisher: Springer
Additional Information: Copyright of this article belongs to Springer.
Department/Centre: Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Date Deposited: 29 Jun 2007
Last Modified: 17 Jan 2012 10:04
URI: http://eprints.iisc.ac.in/id/eprint/11314

Actions (login required)

View Item View Item